Tamaño de fuente:
TIO2 NANOTUBE ANTIREFLECTIVE LAYER PREPARED BY ANODIZATION OF TI-FILMS
Última modificación: 15-08-2016
Resumen
The present study proposes the use of a TiO2 nanotube layer for antireflection coating. The structure, surface morphology and optical property were tested by X-ray diffraction, scanning electron microscopy, spectrophotometer and spectroscopic ellipsometer. The results obtained by fitting ellipsometry spectra in the 450–830 nm range, using a two-sublayers physical model, are in good agreement with the film morphology and in accordance with the optical properties measured. The refractive indices of the top and bottom TiO2 sublayers were 2.4 and 1.6 (at 600 nm), respectively. The minimum reflectivity obtained was less than 0.1% and the average of 2% in the wavelength the range 450-830 nm.