Mücklich, Frank, Saarland University, Department Materials Science and Engineering, Campus D3.3, 66123 Saarbrücken, Germany, Alemania
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Congreso Internacional de Metalurgia y Materiales - T19. Caracterización de materiales por métodos ópticos, acústicos y otros
EXPANDING THE USES OF THE FOCUSED ION BEAM TECHNIQUE: 3D-ANALYSIS OF MORPHOLOGY AND CRYSTALLOGRAPHY OF MICRO AND NANOSTRUCTURES.
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