Mücklich, Frank, Saarland University, Department Materials Science and Engineering, Campus D3.3, 66123 Saarbrücken, Germany, Germany

• - T19. Caracterización de materiales por métodos ópticos, acústicos y otros
  EXPANDING THE USES OF THE FOCUSED ION BEAM TECHNIQUE: 3D-ANALYSIS OF MORPHOLOGY AND CRYSTALLOGRAPHY OF MICRO AND NANOSTRUCTURES.
  Abstract